ALT Accelerated Lifetime Testing
BHJ Bulk Hetero Junction
BIPV Building Integrated PhotoVoltaics
ET Electron Tomography
ETL Electron Transport Layer
FF Fill Factor
FIB Focused Ion-Beam
FMEA Failure Modes and Effects Analysis
HTL Hole Transport Layer
ITO Indium Tin Oxide
Jsc Short Circuit Current
KPM Kelvin Probe Microscopy
NEXAFS Near-Edge X-Ray Absorption Fine Structure
OE-A Organic and Printed Electronics Association
OLAE Organic and Large Area Electronic
OPV Organic Photovoltaics
OTR Oxygen Transmission Rate
R2R Roll-to-Roll Processing
SPM Scanning Probe Microscopy
TEM Transmission Electron Microscopy
UV Ultraviolet Durability Test
Voc Open Circuit Voltage
WVTR Water Vapour Transmission Rate