| ALT | Accelerated Lifetime Testing |
| BHJ | Bulk Hetero Junction |
| BIPV | Building Integrated PhotoVoltaics |
| ET | Electron Tomography |
| ETL | Electron Transport Layer |
| FF | Fill Factor |
| FIB | Focused Ion-Beam |
| FMEA | Failure Modes and Effects Analysis |
| HTL | Hole Transport Layer |
| ITO | Indium Tin Oxide |
| Jsc | Short Circuit Current |
| KPM | Kelvin Probe Microscopy |
| NEXAFS | Near-Edge X-Ray Absorption Fine Structure |
| OE-A | Organic and Printed Electronics Association |
| OLAE | Organic and Large Area Electronic |
| OPV | Organic Photovoltaics |
| OTR | Oxygen Transmission Rate |
| R2R | Roll-to-Roll Processing |
| SPM | Scanning Probe Microscopy |
| TEM | Transmission Electron Microscopy |
| UV | Ultraviolet Durability Test |
| Voc | Open Circuit Voltage |
| WVTR | Water Vapour Transmission Rate |